Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique

The growth of semi-elliptical surface cracks by fatigue was monitored by the AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizi...

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Veröffentlicht in:NDT international 1983-06, Vol.16 (3), p.139-143
Hauptverfasser: Aboutorabi, A.A., Cowling, M.J.
Format: Artikel
Sprache:eng
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Zusammenfassung:The growth of semi-elliptical surface cracks by fatigue was monitored by the AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple NDT technique.
ISSN:0308-9126
DOI:10.1016/0308-9126(83)90036-6