Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique
The growth of semi-elliptical surface cracks by fatigue was monitored by the AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizi...
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Veröffentlicht in: | NDT international 1983-06, Vol.16 (3), p.139-143 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The growth of semi-elliptical surface cracks by fatigue was monitored by the
AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple
NDT technique. |
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ISSN: | 0308-9126 |
DOI: | 10.1016/0308-9126(83)90036-6 |