Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique
The growth of semi-elliptical surface cracks by fatigue was monitored by the AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizi...
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| Veröffentlicht in: | NDT international 1983-06, Vol.16 (3), p.139-143 |
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| container_end_page | 143 |
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| container_issue | 3 |
| container_start_page | 139 |
| container_title | NDT international |
| container_volume | 16 |
| creator | Aboutorabi, A.A. Cowling, M.J. |
| description | The growth of semi-elliptical surface cracks by fatigue was monitored by the
AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple
NDT technique. |
| doi_str_mv | 10.1016/0308-9126(83)90036-6 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_23243850</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0308912683900366</els_id><sourcerecordid>23242708</sourcerecordid><originalsourceid>FETCH-LOGICAL-c395t-53c70e461fdd345dc175255515c2e731c13b9882aafcbecb00f19701bf1f196b3</originalsourceid><addsrcrecordid>eNqNkE1LxDAQhntQcP34Bx56ENFDdZI0_bgIy-IXrHjRc0inEzfabdekFfz3pnbZo3iaYXjmneGJolMGVwxYdg0CiqRkPLsoxGUJILIk24tmu_FBdOj9OwAHKOUsUk-k_eBoTW0fdyZGp_Ej3rjO2IbGgae1Tahp7Ka3qJs4wEYjTaCPB2_bt7hfUTxfxJuuDzE2UD3hqrWfAx1H-0Y3nk629Sh6vbt9WTwky-f7x8V8maAoZZ9IgTlQmjFT1yKVNbJcciklk8gpFwyZqMqi4FobrAgrAMPKHFhlWGiyShxF51NueD2c9b1aW4_hb91SN3jFBU9FIeFfIM-hCGA6geg67x0ZtXF2rd23YqBG1Wp0qkanqhDqV7XKwtrZNl_74Ms43aL1u90y52mejtjNhFGQ8mXJKY-WWqTaOsJe1Z39-84PUxaUbg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23242708</pqid></control><display><type>article</type><title>Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique</title><source>Alma/SFX Local Collection</source><creator>Aboutorabi, A.A. ; Cowling, M.J.</creator><creatorcontrib>Aboutorabi, A.A. ; Cowling, M.J.</creatorcontrib><description>The growth of semi-elliptical surface cracks by fatigue was monitored by the
AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple
NDT technique.</description><identifier>ISSN: 0308-9126</identifier><identifier>DOI: 10.1016/0308-9126(83)90036-6</identifier><identifier>CODEN: NDITDS</identifier><language>eng</language><publisher>Guildford: Elsevier B.V</publisher><subject>Analysing. Testing. Standards ; Applied sciences ; Chemical and electrochemical properties ; crack growth + fatigue ; defect sizing ; electrical measurement ; Exact sciences and technology ; Metals. Metallurgy ; Nondestructive testing ; surface cracks ; Testing for defects</subject><ispartof>NDT international, 1983-06, Vol.16 (3), p.139-143</ispartof><rights>1983</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c395t-53c70e461fdd345dc175255515c2e731c13b9882aafcbecb00f19701bf1f196b3</citedby><cites>FETCH-LOGICAL-c395t-53c70e461fdd345dc175255515c2e731c13b9882aafcbecb00f19701bf1f196b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=9724746$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Aboutorabi, A.A.</creatorcontrib><creatorcontrib>Cowling, M.J.</creatorcontrib><title>Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique</title><title>NDT international</title><description>The growth of semi-elliptical surface cracks by fatigue was monitored by the
AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple
NDT technique.</description><subject>Analysing. Testing. Standards</subject><subject>Applied sciences</subject><subject>Chemical and electrochemical properties</subject><subject>crack growth + fatigue</subject><subject>defect sizing</subject><subject>electrical measurement</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Nondestructive testing</subject><subject>surface cracks</subject><subject>Testing for defects</subject><issn>0308-9126</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNqNkE1LxDAQhntQcP34Bx56ENFDdZI0_bgIy-IXrHjRc0inEzfabdekFfz3pnbZo3iaYXjmneGJolMGVwxYdg0CiqRkPLsoxGUJILIk24tmu_FBdOj9OwAHKOUsUk-k_eBoTW0fdyZGp_Ej3rjO2IbGgae1Tahp7Ka3qJs4wEYjTaCPB2_bt7hfUTxfxJuuDzE2UD3hqrWfAx1H-0Y3nk629Sh6vbt9WTwky-f7x8V8maAoZZ9IgTlQmjFT1yKVNbJcciklk8gpFwyZqMqi4FobrAgrAMPKHFhlWGiyShxF51NueD2c9b1aW4_hb91SN3jFBU9FIeFfIM-hCGA6geg67x0ZtXF2rd23YqBG1Wp0qkanqhDqV7XKwtrZNl_74Ms43aL1u90y52mejtjNhFGQ8mXJKY-WWqTaOsJe1Z39-84PUxaUbg</recordid><startdate>19830601</startdate><enddate>19830601</enddate><creator>Aboutorabi, A.A.</creator><creator>Cowling, M.J.</creator><general>Elsevier B.V</general><general>Butterworth Scientific Limited</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19830601</creationdate><title>Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique</title><author>Aboutorabi, A.A. ; Cowling, M.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c395t-53c70e461fdd345dc175255515c2e731c13b9882aafcbecb00f19701bf1f196b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Analysing. Testing. Standards</topic><topic>Applied sciences</topic><topic>Chemical and electrochemical properties</topic><topic>crack growth + fatigue</topic><topic>defect sizing</topic><topic>electrical measurement</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Nondestructive testing</topic><topic>surface cracks</topic><topic>Testing for defects</topic><toplevel>online_resources</toplevel><creatorcontrib>Aboutorabi, A.A.</creatorcontrib><creatorcontrib>Cowling, M.J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>NDT international</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aboutorabi, A.A.</au><au>Cowling, M.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique</atitle><jtitle>NDT international</jtitle><date>1983-06-01</date><risdate>1983</risdate><volume>16</volume><issue>3</issue><spage>139</spage><epage>143</epage><pages>139-143</pages><issn>0308-9126</issn><coden>NDITDS</coden><abstract>The growth of semi-elliptical surface cracks by fatigue was monitored by the
AC potential technique. Detailed marking of the fracture surface during crack growth allowed correlation of crack profile and potential measurements. A series of modification factors has been produced to allow accurate sizing of such defects from a simple
NDT technique.</abstract><cop>Guildford</cop><pub>Elsevier B.V</pub><doi>10.1016/0308-9126(83)90036-6</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0308-9126 |
| ispartof | NDT international, 1983-06, Vol.16 (3), p.139-143 |
| issn | 0308-9126 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_23243850 |
| source | Alma/SFX Local Collection |
| subjects | Analysing. Testing. Standards Applied sciences Chemical and electrochemical properties crack growth + fatigue defect sizing electrical measurement Exact sciences and technology Metals. Metallurgy Nondestructive testing surface cracks Testing for defects |
| title | Measurement of crack profile of semi-elliptical surface cracks using the AC potential technique |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-19T23%3A43%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20crack%20profile%20of%20semi-elliptical%20surface%20cracks%20using%20the%20AC%20potential%20technique&rft.jtitle=NDT%20international&rft.au=Aboutorabi,%20A.A.&rft.date=1983-06-01&rft.volume=16&rft.issue=3&rft.spage=139&rft.epage=143&rft.pages=139-143&rft.issn=0308-9126&rft.coden=NDITDS&rft_id=info:doi/10.1016/0308-9126(83)90036-6&rft_dat=%3Cproquest_cross%3E23242708%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=23242708&rft_id=info:pmid/&rft_els_id=0308912683900366&rfr_iscdi=true |