Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM

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Veröffentlicht in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1796-1797
Hauptverfasser: Wu, Ryan J., Odlyzko, Michael L., Andre Mkhoyan, K.
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subjects Carbon Nanomaterials and Related Counterparts: Recent Results and Challenges
Physical Sciences Symposia
title Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM
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