Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps

An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, n...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electromagnetic compatibility 2012-08, Vol.54 (4), p.947-950
1. Verfasser: Richelli, Anna
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 950
container_issue 4
container_start_page 947
container_title IEEE transactions on electromagnetic compatibility
container_volume 54
creator Richelli, Anna
description An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, nor external components. Analysis and results are provided for very large interferences, arising from the input pin.
doi_str_mv 10.1109/TEMC.2012.2206815
format Article
fullrecord <record><control><sourceid>pascalfrancis_RIE</sourceid><recordid>TN_cdi_pascalfrancis_primary_26324097</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6239584</ieee_id><sourcerecordid>26324097</sourcerecordid><originalsourceid>FETCH-LOGICAL-c295t-77b4ff33fbf540e510cb5cecd8e9bbe11d39437037b6e790937b5e83a1a1a1eb3</originalsourceid><addsrcrecordid>eNo9j01LAzEQhoMoWKs_QLzk4nFrJtlskmNZqi609mAVb0uSzpaV_WJTlf57d2kpcxiGeZ9hHkLugc0AmHnaLFbpjDPgM85ZokFekAlIqSPQ6uuSTBgDHRmh5DW5CeF7GGPJxYTorPE92lA2O7pYZTSr65-m3B9o2dC39hcrumz_os-22tsd0nS1fqfrbl534ZZcFbYKeHfqU_LxvNikr9Fy_ZKl82XkuZH7SCkXF4UQhStkzFAC80569FuNxjkE2AoTC8WEcgkqw4YXnUQtLIyFTkwJHO_6vg2hxyLv-rK2_SEHlo_q-aiej-r5SX1gHo9MZ4O3VdHbxpfhDPJE8JgZNeQejrkSEc_rhAsjdSz-AZrWYL0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps</title><source>IEEE Electronic Library (IEL)</source><creator>Richelli, Anna</creator><creatorcontrib>Richelli, Anna</creatorcontrib><description>An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, nor external components. Analysis and results are provided for very large interferences, arising from the input pin.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2012.2206815</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplifiers ; Applied sciences ; Circuit properties ; CMOS ; CMOS integrated circuits ; CMOS technology ; Design. Technologies. Operation analysis. Testing ; Electric, optical and optoelectronic circuits ; Electromagnetic compatibility ; Electromagnetic interference ; Electromagnetics ; Electronic circuits ; Electronics ; Exact sciences and technology ; immunity to electromagnetic interferences ; Information, signal and communications theory ; Integrated circuits ; operational amplifier ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Telecommunications and information theory ; Topology ; Transistors</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2012-08, Vol.54 (4), p.947-950</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c295t-77b4ff33fbf540e510cb5cecd8e9bbe11d39437037b6e790937b5e83a1a1a1eb3</citedby><cites>FETCH-LOGICAL-c295t-77b4ff33fbf540e510cb5cecd8e9bbe11d39437037b6e790937b5e83a1a1a1eb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6239584$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6239584$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=26324097$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Richelli, Anna</creatorcontrib><title>Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, nor external components. Analysis and results are provided for very large interferences, arising from the input pin.</description><subject>Amplifiers</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>CMOS</subject><subject>CMOS integrated circuits</subject><subject>CMOS technology</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electromagnetic compatibility</subject><subject>Electromagnetic interference</subject><subject>Electromagnetics</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>immunity to electromagnetic interferences</subject><subject>Information, signal and communications theory</subject><subject>Integrated circuits</subject><subject>operational amplifier</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Telecommunications and information theory</subject><subject>Topology</subject><subject>Transistors</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9j01LAzEQhoMoWKs_QLzk4nFrJtlskmNZqi609mAVb0uSzpaV_WJTlf57d2kpcxiGeZ9hHkLugc0AmHnaLFbpjDPgM85ZokFekAlIqSPQ6uuSTBgDHRmh5DW5CeF7GGPJxYTorPE92lA2O7pYZTSr65-m3B9o2dC39hcrumz_os-22tsd0nS1fqfrbl534ZZcFbYKeHfqU_LxvNikr9Fy_ZKl82XkuZH7SCkXF4UQhStkzFAC80569FuNxjkE2AoTC8WEcgkqw4YXnUQtLIyFTkwJHO_6vg2hxyLv-rK2_SEHlo_q-aiej-r5SX1gHo9MZ4O3VdHbxpfhDPJE8JgZNeQejrkSEc_rhAsjdSz-AZrWYL0</recordid><startdate>20120801</startdate><enddate>20120801</enddate><creator>Richelli, Anna</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20120801</creationdate><title>Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps</title><author>Richelli, Anna</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c295t-77b4ff33fbf540e510cb5cecd8e9bbe11d39437037b6e790937b5e83a1a1a1eb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Amplifiers</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>CMOS</topic><topic>CMOS integrated circuits</topic><topic>CMOS technology</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electromagnetic compatibility</topic><topic>Electromagnetic interference</topic><topic>Electromagnetics</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>immunity to electromagnetic interferences</topic><topic>Information, signal and communications theory</topic><topic>Integrated circuits</topic><topic>operational amplifier</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Telecommunications and information theory</topic><topic>Topology</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Richelli, Anna</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Richelli, Anna</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2012-08-01</date><risdate>2012</risdate><volume>54</volume><issue>4</issue><spage>947</spage><epage>950</epage><pages>947-950</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, nor external components. Analysis and results are provided for very large interferences, arising from the input pin.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TEMC.2012.2206815</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9375
ispartof IEEE transactions on electromagnetic compatibility, 2012-08, Vol.54 (4), p.947-950
issn 0018-9375
1558-187X
language eng
recordid cdi_pascalfrancis_primary_26324097
source IEEE Electronic Library (IEL)
subjects Amplifiers
Applied sciences
Circuit properties
CMOS
CMOS integrated circuits
CMOS technology
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electromagnetic compatibility
Electromagnetic interference
Electromagnetics
Electronic circuits
Electronics
Exact sciences and technology
immunity to electromagnetic interferences
Information, signal and communications theory
Integrated circuits
operational amplifier
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Telecommunications and information theory
Topology
Transistors
title Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-16T15%3A44%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Increasing%20EMI%20Immunity%20in%20Novel%20Low-Voltage%20CMOS%20OpAmps&rft.jtitle=IEEE%20transactions%20on%20electromagnetic%20compatibility&rft.au=Richelli,%20Anna&rft.date=2012-08-01&rft.volume=54&rft.issue=4&rft.spage=947&rft.epage=950&rft.pages=947-950&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/TEMC.2012.2206815&rft_dat=%3Cpascalfrancis_RIE%3E26324097%3C/pascalfrancis_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6239584&rfr_iscdi=true