Test system incorporating a field effect transistor sensor

A test system in accordance with the invention includes a field effect transistor (FET) sensor that is operable to detect an electric field present in an area located adjacent to a sensor surface of the FET sensor and generate thereby, a change in the drain-source current of the FET sensor. The chan...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SCHROEDER DALE W, DEPUE MARSHALL THOMAS
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A test system in accordance with the invention includes a field effect transistor (FET) sensor that is operable to detect an electric field present in an area located adjacent to a sensor surface of the FET sensor and generate thereby, a change in the drain-source current of the FET sensor. The change in drain-source current is typically detected by a current detector of the test system.