DEFECT REPAIR METHOD FOR GRAPHENE FILM, AND TRANSMISSIVITY MEASURING APPARATUS FOR GRAPHENE FILM

PROBLEM TO BE SOLVED: To provide a measuring apparatus capable of measuring a local transmissivity of a graphene film in a micrometer order, and a defect repair method for the graphene film.SOLUTION: A defect repair method for a graphene film includes detecting a defective spot of the graphene film...

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Bibliographische Detailangaben
Hauptverfasser: ISHIHARA MASANORI, HASEGAWA MASATAKA, OMURA HIDEKI, OKIKAWA YUKI
Format: Patent
Sprache:eng ; jpn
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