Method and X-ray inspection system, in particular for non-destructively inspecting objects
The invention relates to a method for non-destructively inspecting an object (104), wherein electromagnetic radiation (113, 123, 133) is passed through the object (104) and intensity values of beams that are not absorbed are measured and evaluated, wherein the method comprises the following steps: p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a method for non-destructively inspecting an object (104), wherein electromagnetic radiation (113, 123, 133) is passed through the object (104) and intensity values of beams that are not absorbed are measured and evaluated, wherein the method comprises the following steps: producing a three-dimensional data set (300), in which a first material quantity value corresponding to a first material property of the object (104) is associated with each of individual spatial elements (301) of the object (301) by means of a computer tomography method; determining an inspection space (310) in the three-dimensional data set (300) representing the object (104), which inspection space (310) has spatial elements (301) whose first material quantity value lies in a predetermined value range; deriving values each corresponding to a spatial geometric quantity of the inspection space (310) in a predetermined projection direction (PR1, PR2) on the basis of the three-dimensional data set (300); producing a |
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