Method and X-ray inspection system, in particular for non-destructively inspecting objects

Method and X-ray inspection system, in particular for non-destructively inspecting objects

The invention relates to a method for non-destructively inspecting an object (104), wherein electromagnetic radiation (113, 123, 133) is passed through the object (104) and intensity values of beams that are not absorbed are measured and evaluated, wherein the method comprises the following steps: p...

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Hauptverfasser: MADER ANDREAS, NITTIKOWSKI JORG, KONIG SEBASTIAN, DREISEITEL PIA, NAUMANN DIRK
Format: Patent
Sprache:chi ; eng
Schlagworte:
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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creator MADER ANDREAS
NITTIKOWSKI JORG
KONIG SEBASTIAN
DREISEITEL PIA
NAUMANN DIRK
description The invention relates to a method for non-destructively inspecting an object (104), wherein electromagnetic radiation (113, 123, 133) is passed through the object (104) and intensity values of beams that are not absorbed are measured and evaluated, wherein the method comprises the following steps: producing a three-dimensional data set (300), in which a first material quantity value corresponding to a first material property of the object (104) is associated with each of individual spatial elements (301) of the object (301) by means of a computer tomography method; determining an inspection space (310) in the three-dimensional data set (300) representing the object (104), which inspection space (310) has spatial elements (301) whose first material quantity value lies in a predetermined value range; deriving values each corresponding to a spatial geometric quantity of the inspection space (310) in a predetermined projection direction (PR1, PR2) on the basis of the three-dimensional data set (300); producing a
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subjects DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
title Method and X-ray inspection system, in particular for non-destructively inspecting objects
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