An introduction to mixed-signal IC test and measurement
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
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Format: | E-Book |
Sprache: | English |
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New York
Oxford University Press
©2012
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Ausgabe: | 2nd ed. |
Schriftenreihe: | The Oxford series in electrical and computer engineering
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Online-Zugang: | Volltext |
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020 | |a 1613449488 | ||
020 | |a 9781613449486 | ||
020 | |z 0199796211 | ||
020 | |z 9780199796212 | ||
100 | 1 | |a Roberts, Gordon W. |d 1959- | |
245 | 1 | 3 | |a An introduction to mixed-signal IC test and measurement |c Gordon Roberts, Friedrich Taenzler, Mark Burns |
250 | |a 2nd ed. | ||
264 | 1 | |a New York |b Oxford University Press |c ©2012 | |
300 | |a 1 Online-Ressource (xxv, 836 Seiten) |b Illustrationen | ||
336 | |b txt | ||
337 | |b c | ||
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490 | 1 | |a The Oxford series in electrical and computer engineering | |
500 | |a Burns' name appears first on the previous edition. | ||
520 | |a "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher | ||
700 | 1 | |a Burns, Mark |d 1962- | |
700 | 1 | |a Taenzler, Friedrich | |
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Datensatz im Suchindex
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id | ZDB-10-ESC-ocn802809251 |
illustrated | Illustrated |
indexdate | 2024-12-18T12:06:32Z |
institution | BVB |
isbn | 1613449488 9781613449486 |
language | English |
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physical | 1 Online-Ressource (xxv, 836 Seiten) Illustrationen |
psigel | ZDB-10-ESC |
publishDate | 2012 |
publishDateSearch | 2012 |
publishDateSort | 2012 |
publisher | Oxford University Press |
record_format | marc |
series2 | The Oxford series in electrical and computer engineering |
spelling | Roberts, Gordon W. 1959- An introduction to mixed-signal IC test and measurement Gordon Roberts, Friedrich Taenzler, Mark Burns 2nd ed. New York Oxford University Press ©2012 1 Online-Ressource (xxv, 836 Seiten) Illustrationen txt c cr The Oxford series in electrical and computer engineering Burns' name appears first on the previous edition. "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher Burns, Mark 1962- Taenzler, Friedrich Erscheint auch als Druck-Ausgabe 9780199796212 TUM01 ZDB-10-ESC TUM_PDA_ESC https://app.knovel.com/hotlink/toc/id:kpIMSICTM4/introduction-to-mixed?kpromoter=marc Volltext |
spellingShingle | Roberts, Gordon W. 1959- An introduction to mixed-signal IC test and measurement |
title | An introduction to mixed-signal IC test and measurement |
title_auth | An introduction to mixed-signal IC test and measurement |
title_exact_search | An introduction to mixed-signal IC test and measurement |
title_full | An introduction to mixed-signal IC test and measurement Gordon Roberts, Friedrich Taenzler, Mark Burns |
title_fullStr | An introduction to mixed-signal IC test and measurement Gordon Roberts, Friedrich Taenzler, Mark Burns |
title_full_unstemmed | An introduction to mixed-signal IC test and measurement Gordon Roberts, Friedrich Taenzler, Mark Burns |
title_short | An introduction to mixed-signal IC test and measurement |
title_sort | introduction to mixed signal ic test and measurement |
url | https://app.knovel.com/hotlink/toc/id:kpIMSICTM4/introduction-to-mixed?kpromoter=marc |
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