An introduction to mixed-signal IC test and measurement
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
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| Format: | E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Oxford University Press
©2012
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| Ausgabe: | 2nd ed. |
| Schriftenreihe: | The Oxford series in electrical and computer engineering
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| Online-Zugang: | Volltext |
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| Zusammenfassung: | "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher |
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| Beschreibung: | Burns' name appears first on the previous edition. |
| Beschreibung: | 1 Online-Ressource (xxv, 836 Seiten) Illustrationen |
| ISBN: | 1613449488 9781613449486 |