The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening
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| Format: | Elektronisch E-Book |
| Sprache: | English |
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Berlin
Humboldt-Universität zu Berlin
2021
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| Ausgabe: | [Zweitveröffentlichung] |
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Datensatz im Suchindex
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| spelling | Park, Soohyung Verfasser aut The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul-Ho Lee, Lain-Jong Li, Xiaomin Xu, Vincent Tung, Emil J. W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, and Norbert Koch [Zweitveröffentlichung] Berlin Humboldt-Universität zu Berlin 2021 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Sonderdruck aus ACS nano / American Chemical Society 2021 15 (9), 14794-14803 10.1021/acsnano.1c04825 https://doi.org/10.18452/24563 Verlag kostenfrei Volltext |
| spellingShingle | Park, Soohyung The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title_auth | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title_exact_search | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title_exact_search_txtP | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title_full | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul-Ho Lee, Lain-Jong Li, Xiaomin Xu, Vincent Tung, Emil J. W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, and Norbert Koch |
| title_fullStr | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul-Ho Lee, Lain-Jong Li, Xiaomin Xu, Vincent Tung, Emil J. W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, and Norbert Koch |
| title_full_unstemmed | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening Soohyung Park, Thorsten Schultz, Dongguen Shin, Niklas Mutz, Areej Aljarb, Hee Seong Kang, Chul-Ho Lee, Lain-Jong Li, Xiaomin Xu, Vincent Tung, Emil J. W. List-Kratochvil, Sylke Blumstengel, Patrick Amsalem, and Norbert Koch |
| title_short | The Schottky–Mott rule expanded for two-dimensional semiconductors: influence of substrate dielectric screening |
| title_sort | the schottky mott rule expanded for two dimensional semiconductors influence of substrate dielectric screening |
| url | https://doi.org/10.18452/24563 |
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