Characterization Methods for Submicron MOSFETs

It is true that the Metal-Oxide-Semiconductor Field-Eeffect Transistor (MOSFET) is a key component in modern microelectronics. It is also true that there is a lack of comprehensive books on MOSFET characterization in gen­ eral. However there is more than that as to the motivation and reasons behind...

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Bibliographische Detailangaben

Weitere Verfasser:	Haddara, Hisham (HerausgeberIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Boston, MA Springer US 1995
Schriftenreihe:	The Kluwer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing 352
Schlagworte:	Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Electrical engineering Electronics Microelectronics Electronic circuits MOS-FET Nanostruktur
Online-Zugang:	BTU01 URL des Erstveröffentlichers
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