Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic...
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| Hauptverfasser: | , |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2003
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| Schriftenreihe: | Springer Series in Materials Science
51 |
| Schlagworte: | |
| Online-Zugang: | DE-573 DE-634 URL des Erstveröffentlichers |
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