VLSI reliability
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
San Diego
Academic Press
1990
|
| Schriftenreihe: | VLSI electronics
v. 22 |
| Schlagworte: | |
| Online-Zugang: | DE-1046 URL des Erstveröffentlichers |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044389649 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s1990 xx a||| o|||| 00||| eng d | ||
| 020 | |a 9781483296586 |9 978-1-4832-9658-6 | ||
| 020 | |a 148329658X |9 1-4832-9658-X | ||
| 020 | |a 0122341228 |9 0-12-234122-8 | ||
| 020 | |a 9780122341229 |9 978-0-12-234122-9 | ||
| 035 | |a (ZDB-33-ESD)ocn893872955 | ||
| 035 | |a (OCoLC)893872955 | ||
| 035 | |a (DE-599)BVBBV044389649 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 621.39/5 |2 22 | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 100 | 1 | |a Sabnis, Anant G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a VLSI reliability |c Anant G. Sabnis |
| 264 | 1 | |a San Diego |b Academic Press |c 1990 | |
| 300 | |a 1 online resource (xiii, 207 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a VLSI electronics |v v. 22 | |
| 500 | |a Includes bibliographical references and index | ||
| 520 | |a As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging | ||
| 650 | 7 | |a Integrated circuits / Very large scale integration / Reliability |2 fast | |
| 650 | 7 | |a Fiabilité |2 ram | |
| 650 | 7 | |a Circuits intégrés à très grande échelle |2 ram | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Reliability | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Sabnis, Anant G. |t VLSI reliability |z 0122341228 |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/07367031/22 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029791871 | |
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/07367031/22 |l DE-1046 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1819300310928064514 |
|---|---|
| any_adam_object | |
| author | Sabnis, Anant G. |
| author_facet | Sabnis, Anant G. |
| author_role | aut |
| author_sort | Sabnis, Anant G. |
| author_variant | a g s ag ags |
| building | Verbundindex |
| bvnumber | BV044389649 |
| classification_rvk | ZN 4040 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocn893872955 (OCoLC)893872955 (DE-599)BVBBV044389649 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02008nam a2200457zcb4500</leader><controlfield tag="001">BV044389649</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s1990 xx a||| o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781483296586</subfield><subfield code="9">978-1-4832-9658-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">148329658X</subfield><subfield code="9">1-4832-9658-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0122341228</subfield><subfield code="9">0-12-234122-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780122341229</subfield><subfield code="9">978-0-12-234122-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn893872955</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)893872955</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044389649</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sabnis, Anant G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI reliability</subfield><subfield code="c">Anant G. Sabnis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Diego</subfield><subfield code="b">Academic Press</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xiii, 207 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">VLSI electronics</subfield><subfield code="v">v. 22</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Integrated circuits / Very large scale integration / Reliability</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Fiabilité</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Circuits intégrés à très grande échelle</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Sabnis, Anant G.</subfield><subfield code="t">VLSI reliability</subfield><subfield code="z">0122341228</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/07367031/22</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029791871</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/07367031/22</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044389649 |
| illustrated | Illustrated |
| indexdate | 2024-12-24T05:59:38Z |
| institution | BVB |
| isbn | 9781483296586 148329658X 0122341228 9780122341229 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029791871 |
| oclc_num | 893872955 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 online resource (xiii, 207 pages) illustrations |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Academic Press |
| record_format | marc |
| series2 | VLSI electronics |
| spelling | Sabnis, Anant G. Verfasser aut VLSI reliability Anant G. Sabnis San Diego Academic Press 1990 1 online resource (xiii, 207 pages) illustrations txt rdacontent c rdamedia cr rdacarrier VLSI electronics v. 22 Includes bibliographical references and index As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability Erscheint auch als Druck-Ausgabe Sabnis, Anant G. VLSI reliability 0122341228 http://www.sciencedirect.com/science/bookseries/07367031/22 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Sabnis, Anant G. VLSI reliability Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability |
| title | VLSI reliability |
| title_auth | VLSI reliability |
| title_exact_search | VLSI reliability |
| title_full | VLSI reliability Anant G. Sabnis |
| title_fullStr | VLSI reliability Anant G. Sabnis |
| title_full_unstemmed | VLSI reliability Anant G. Sabnis |
| title_short | VLSI reliability |
| title_sort | vlsi reliability |
| topic | Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability |
| topic_facet | Integrated circuits / Very large scale integration / Reliability Fiabilité Circuits intégrés à très grande échelle Integrated circuits Very large scale integration Reliability |
| url | http://www.sciencedirect.com/science/bookseries/07367031/22 |
| work_keys_str_mv | AT sabnisanantg vlsireliability |