Time-of-flight spectrometry of recoiled atoms in the analysis of thin films
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Helsinki
Finnish Acad. of Technology
1997
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Schriftenreihe: | Acta polytechnica Scandinavica / Applied physics series
212 |
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MARC
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035 | |a (DE-599)BVBBV012002708 | ||
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082 | 0 | |a 537.622 |2 21 | |
100 | 1 | |a Jokinen, Janne |e Verfasser |4 aut | |
245 | 1 | 0 | |a Time-of-flight spectrometry of recoiled atoms in the analysis of thin films |c Janne Jokinen |
264 | 1 | |a Helsinki |b Finnish Acad. of Technology |c 1997 | |
300 | |a 38 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Acta polytechnica Scandinavica / Applied physics series |v 212 | |
500 | |a Zugl.: Helsinki, Univ., Diss., 1997 | ||
650 | 4 | |a Affichage électroluminescent | |
650 | 7 | |a Couches minces |2 ram | |
650 | 7 | |a Faisceaux ioniques |2 ram | |
650 | 4 | |a Recul élastique | |
650 | 7 | |a Spectrométrie de masse à temps de vol |2 ram | |
650 | 7 | |a Épitaxie |2 ram | |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
810 | 2 | |a Applied physics series |t Acta polytechnica Scandinavica |v 212 |w (DE-604)BV023821053 |9 212 | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-008121912 |
Datensatz im Suchindex
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any_adam_object | |
author | Jokinen, Janne |
author_facet | Jokinen, Janne |
author_role | aut |
author_sort | Jokinen, Janne |
author_variant | j j jj |
building | Verbundindex |
bvnumber | BV012002708 |
ctrlnum | (OCoLC)42710144 (DE-599)BVBBV012002708 |
dewey-full | 537.622 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 537 - Electricity and electronics |
dewey-raw | 537.622 |
dewey-search | 537.622 |
dewey-sort | 3537.622 |
dewey-tens | 530 - Physics |
discipline | Physik |
format | Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV012002708 |
illustrated | Illustrated |
indexdate | 2024-12-23T14:47:23Z |
institution | BVB |
isbn | 9525148165 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008121912 |
oclc_num | 42710144 |
open_access_boolean | |
owner | DE-355 DE-BY-UBR DE-83 |
owner_facet | DE-355 DE-BY-UBR DE-83 |
physical | 38 S. Ill., graph. Darst. |
publishDate | 1997 |
publishDateSearch | 1997 |
publishDateSort | 1997 |
publisher | Finnish Acad. of Technology |
record_format | marc |
series2 | Acta polytechnica Scandinavica / Applied physics series |
spelling | Jokinen, Janne Verfasser aut Time-of-flight spectrometry of recoiled atoms in the analysis of thin films Janne Jokinen Helsinki Finnish Acad. of Technology 1997 38 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Acta polytechnica Scandinavica / Applied physics series 212 Zugl.: Helsinki, Univ., Diss., 1997 Affichage électroluminescent Couches minces ram Faisceaux ioniques ram Recul élastique Spectrométrie de masse à temps de vol ram Épitaxie ram (DE-588)4113937-9 Hochschulschrift gnd-content Applied physics series Acta polytechnica Scandinavica 212 (DE-604)BV023821053 212 |
spellingShingle | Jokinen, Janne Time-of-flight spectrometry of recoiled atoms in the analysis of thin films Affichage électroluminescent Couches minces ram Faisceaux ioniques ram Recul élastique Spectrométrie de masse à temps de vol ram Épitaxie ram |
subject_GND | (DE-588)4113937-9 |
title | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films |
title_auth | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films |
title_exact_search | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films |
title_full | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films Janne Jokinen |
title_fullStr | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films Janne Jokinen |
title_full_unstemmed | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films Janne Jokinen |
title_short | Time-of-flight spectrometry of recoiled atoms in the analysis of thin films |
title_sort | time of flight spectrometry of recoiled atoms in the analysis of thin films |
topic | Affichage électroluminescent Couches minces ram Faisceaux ioniques ram Recul élastique Spectrométrie de masse à temps de vol ram Épitaxie ram |
topic_facet | Affichage électroluminescent Couches minces Faisceaux ioniques Recul élastique Spectrométrie de masse à temps de vol Épitaxie Hochschulschrift |
volume_link | (DE-604)BV023821053 |
work_keys_str_mv | AT jokinenjanne timeofflightspectrometryofrecoiledatomsintheanalysisofthinfilms |