Stability of High-Temperature Dielectric Properties for (1 − x)Ba0.8Ca0.2TiO3-xBi(Mg0.5Ti0.5)O3 Ceramics

Ceramics in the solid solution system, (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3, were prepared by a conventional mixed oxide route. Single‐phase perovskite‐type X‐ray diffraction patterns were observed for compositions x 300°C. Comparisons of dielectric properties with other materials proposed for hi...

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Veröffentlicht in:Journal of the American Ceramic Society 2013-09, Vol.96 (9), p.2887-2892
Hauptverfasser: Zeb, Aurang, Milne, Steven J.
Format: Artikel
Sprache:eng
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Zusammenfassung:Ceramics in the solid solution system, (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3, were prepared by a conventional mixed oxide route. Single‐phase perovskite‐type X‐ray diffraction patterns were observed for compositions x 300°C. Comparisons of dielectric properties with other materials proposed for high‐temperature capacitor applications suggest that (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3 ceramics are a promising base material for further development.
ISSN:0002-7820
1551-2916
DOI:10.1111/jace.12412