Stability of High-Temperature Dielectric Properties for (1 − x)Ba0.8Ca0.2TiO3-xBi(Mg0.5Ti0.5)O3 Ceramics
Ceramics in the solid solution system, (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3, were prepared by a conventional mixed oxide route. Single‐phase perovskite‐type X‐ray diffraction patterns were observed for compositions x 300°C. Comparisons of dielectric properties with other materials proposed for hi...
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Veröffentlicht in: | Journal of the American Ceramic Society 2013-09, Vol.96 (9), p.2887-2892 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Ceramics in the solid solution system, (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3, were prepared by a conventional mixed oxide route. Single‐phase perovskite‐type X‐ray diffraction patterns were observed for compositions x 300°C. Comparisons of dielectric properties with other materials proposed for high‐temperature capacitor applications suggest that (1 − x)Ba0.8Ca0.2TiO3–xBi(Mg0.5Ti0.5)O3 ceramics are a promising base material for further development. |
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ISSN: | 0002-7820 1551-2916 |
DOI: | 10.1111/jace.12412 |