EPITAXIAL-GROWTH OF BATIO3 THIN-FILMS BY PLASMA-ENHANCED METALORGANIC CHEMICAL VAPOR-DEPOSITION

High-quality BaTiO3 thin films have been epitaxially grown on (001) LaAlO3 and (001) NdGaO3 substrates by plasma-enhanced metalorganic chemical vapor deposition at a substrate temperature of 680-degrees-C. X-ray diffraction theta-2-theta, omega, and phi-scan results all indicate that single-crystall...

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Veröffentlicht in:Applied physics letters 1992-03, Vol.60 (9), p.1144-1146
Hauptverfasser: CHERN, CS, ZHAO, J, LUO, L, LU, P, LI, YQ, NORRIS, P, KEAR, B, COSANDEY, F, MAGGIORE, CJ, GALLOIS, B, WILKENS, BJ
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Sprache:eng
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Zusammenfassung:High-quality BaTiO3 thin films have been epitaxially grown on (001) LaAlO3 and (001) NdGaO3 substrates by plasma-enhanced metalorganic chemical vapor deposition at a substrate temperature of 680-degrees-C. X-ray diffraction theta-2-theta, omega, and phi-scan results all indicate that single-crystalline BaTiO3 thin films were epitaxially grown on the substrates with [100] orientation perpendicular to the substrates. The high degree of epitaxial crystallinity is further confirmed by Rutherford backscattering spectrometry which gives a minimum yield of 7.5% and 11% for films deposited on LaAlO3 and NdGaO3, respectively. Cross-section high-resolution electron microscopy images also showed that the layer epitaxy of BaTiO3 was characterized by an atomically abrupt film/substrate interface. Scanning electron micrographs showed that these films had very smooth surface morphologies.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.106433