Semi-insulating GaAs detectors degraded by 8 MeV electrons up to 1500 kGy

Radiation degradation of semi-insulating GaAs detectors by 8 MeV electrons up to doses of 1500 kGy is studied in this paper. The influence of irradiation on GaAs material parameters and on spectrometric and electrical properties of fabricated detectors is evaluated. The detector material was degraded before contact preparation, which ensured separation of radiation degradation solely to the bulk material, excluding the contact degradation. The positron annihilation lifetime spectroscopy (PALS) was involved to characterize the substrate material together with galvanometric measurements. Radiation-induced mono-vacancies were clearly identified by PALS in the irradiated materials with increasing concentration up to 2.8 x 10(16) cm(-3) at maximal applied dose. In correlation with defect concentration the electron Hall mobility decreased with dose down to 3270 cm(2) V-1 s(-1) and resistivity increased up to 5.22 x 10(8) Omega cm at 1500 kGy. The bulk material properties influenced the parameters of fabricated detectors. The detectors lost their current blocking behaviour at 1000 kGy according to current-voltage measurements. The charge collection efficiency during alpha-particle and gamma ray measurements almost exponentially decreased with applied dose from initial 40% down to 5% at 1500 kGy in the case of alpha spectrometry and from 48% to 12% at 500 kGy for gamma spectrometry.