Modulation Linearity Characterization of Si Ring Modulators

Modulation Linearity Characterization of Si Ring Modulators

Modulation linearity of Si ring modulators (RMs) is investigated through the numerical simulation based on the coupled-mode theory and experimental verification. Numerical values of the key parameters needed for the simulation are experimentally extracted. Simulation and measurement results agree we...

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Veröffentlicht in:Journal of lightwave technology 2021-12, Vol.39 (24), p.7842-7849
Hauptverfasser: Jo, Youngkwan, Mai, Christian, Lischke, Stefan, Zimmermann, Lars, Choi, Woo-Young
Format: Artikel
Sprache:eng
Schlagworte:
Coupled modes
Engineering
Engineering, Electrical & Electronic
Linearity
Microwave photonics
Modulation
modulation linearity
Modulators
Nonlinear optics
Optical filters
Optical modulation
Optics
Physical Sciences
Science & Technology
Si ring modulator
Silicon
Simulation
Technology
Telecommunications
Voltage measurement
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Zusammenfassung:Modulation linearity of Si ring modulators (RMs) is investigated through the numerical simulation based on the coupled-mode theory and experimental verification. Numerical values of the key parameters needed for the simulation are experimentally extracted. Simulation and measurement results agree well. With these, the influence of input optical wavelength and power on the Si RM linearity are characterized.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2021.3093463