Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid

A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of an α-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid. [Display omitted] •Site-specific Al alloy APT specimens are produced.•No adverse effects were observed when using Xe plasma FIB to produce Al APT specimens.•Chemical segregation is observed and characterised within an α-Al(Fe,Mn)Si dispersoid.•Interfacial segregation of Mg and Cu is found at dispersoid/matrix phase-boundary.