Displacement Damage Effects Mitigation Approach for Heterojunction Bipolar Transistor Frequency Synthesizers
This work focuses on the design issues of radio frequency (RF) bipolar integrated circuits (ICs) as a part of frequency synthesizers for extreme environmental applications. It is shown that silicon-germanium (SiGe) and gallium arsenide (GaAs) heterojunction bipolar transistors (HBTs) as well as bipo...
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Veröffentlicht in: | IEEE transactions on nuclear science 2020-11, Vol.67 (11), p.2396-2404 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | This work focuses on the design issues of radio frequency (RF) bipolar integrated circuits (ICs) as a part of frequency synthesizers for extreme environmental applications. It is shown that silicon-germanium (SiGe) and gallium arsenide (GaAs) heterojunction bipolar transistors (HBTs) as well as bipolar RF ICs (including frequency dividers, voltage-controlled oscillators, and wide-band amplifiers) are highly sensitive to ambient temperature and radiation-induced displacement damage. This article also presents a design approach based on specialized HBT macromodels and hardening techniques. |
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ISSN: | 0018-9499 1558-1578 |
DOI: | 10.1109/TNS.2020.3015560 |