Optical characterization of low temperature amorphous MoOx, WOX, and VOx prepared by pulsed laser deposition

•Amorphous MoOx, WOx, and VOx were prepared by pulsed laser deposition.•Films demonstrate high transparency and high work function.•Oxygen pressure is a key optimization parameter for pulsed laser deposition.•Photothermal deflection spectroscopy decouples absorptance and reflectance effects.•Absorpt...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Thin solid films 2020-01, Vol.693, p.137690, Article 137690
Hauptverfasser:	Horynová, Eva, Romanyuk, Oleksandr, Horák, Lukáš, Remeš, Zdeněk, Conrad, Brianna, Peter Amalathas, Amalraj, Landová, Lucie, Houdková, Jana, Jiříček, Petr, Finsterle, Tomáš, Holovský, Jakub
Format:	Artikel
Sprache:	eng
Schlagworte:	Materials Science Materials Science, Coatings & Films Materials Science, Multidisciplinary Optical spectroscopy Photothermal deflection spectroscopy Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology Transparent metal oxide Urbach energy Work function Work function, Pulsed laser deposition
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	•Amorphous MoOx, WOx, and VOx were prepared by pulsed laser deposition.•Films demonstrate high transparency and high work function.•Oxygen pressure is a key optimization parameter for pulsed laser deposition.•Photothermal deflection spectroscopy decouples absorptance and reflectance effects.•Absorption coefficient and refractive index for a range of materials are given.
ISSN:	0040-6090 1879-2731
DOI:	10.1016/j.tsf.2019.137690