Characterization of rapid thermally processed LiMn2O4 thin films derived from solution deposition

Cathode material LiMn2O4 thin films were prepared through solution deposition followed by rapid thermal annealing. The phase identification and surface morphology were studied by X-ray diffraction and scanning electron microscopy. Electrical and electrochemical properties were examined by four-probe method, cyclic voltammetry and galvanostatic charge-discharge experiments. The results show that the film prepared by this method is homogeneous, dense and crack-free. As the annealing temperature and annealing time increase, the electronic resistivity decreases, while the capacity of the films increases generally. For the thin films annealed at different temperatures for 2 min, the thin film annealed at 800 deg C has the best cycling behavior with the capacity loss of 0.021% per cycle. While for the thin films annealed at 750 deg C for different times, the film annealed for 4 min possesses the best cycling performance with a capacity loss of 0.025% per cycle. For the lithium diffusion coefficient in LiMn2O4 thin film, its magnitude order is 10(-11) cm2 * s-1.