Constant-Step Stress Accelerated Life Test of VFD under Logarithmic Normal Distribution Case

In order to solve the life problem of vacuum fluorescent display （VFD） within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature increased. Statistical analysis was done by applying logarithmic normal distribution for describing the life, and least square method （LSM） for estimating logarithmic normal parameters. Self-designed special software was used to predict the VFD life. It is verified by numerical results that the VFD life follows logarithmic normal distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. The accurate calculation of the key parameters enables the rapid estimation of VFD life.