Doping copper ions in a metal-organic framework (UiO-66-NH2): Location effect examined by ultrafast spectroscopy
We constructed two types of copper-doped metal-organic framework (MOF), i.e., Cu@UiO- 66-NH2 and Cu-UiO-66-NH2. In the former, Cu2+ ions are impregnated in the pore space of the amine-functionalized, Zr-based UiO-66-NH2; while in the latter, Cu2+ ions are in-corporated to form a bimetal-center MOF,...
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Veröffentlicht in: | Chinese journal of chemical physics 2020-08, Vol.33 (4), p.394-400 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We constructed two types of copper-doped metal-organic framework (MOF), i.e., Cu@UiO- 66-NH2 and Cu-UiO-66-NH2. In the former, Cu2+ ions are impregnated in the pore space of the amine-functionalized, Zr-based UiO-66-NH2; while in the latter, Cu2+ ions are in-corporated to form a bimetal-center MOF, with Zr4+ being partially replaced by Cu2+ in the Zr−O oxo-clusters. Ultrafast spectroscopy revealed that the photoinduced relaxation kinetics associated with the ligand-to-cluster charge-transfer state is promoted for both Cu-doped MOFs relative to undoped one, but in a sequence of Cu-UiO-66-NH2>Cu@UiO-66-NH2>UiO-66-NH2. Such a sequence turned to be in line with the trend observed in the visible-light photocatalytic hydrogen evolution activity tests on the three MOFs. These findings highlighted the subtle effect of copper-doping location in this Zr-based MOF system, further suggesting that rational engineering of the specific metal-doping location in alike MOF systems to promote the photoinduced charge separation and hence suppress the detrimental charge recombination therein is beneficial for achieving improved performances in MOF-based photocatalysis. |
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ISSN: | 1674-0068 2327-2244 |
DOI: | 10.1063/1674-0068/cjcp2005070 |