A development of lifetime measurement based on the differential decay curve method

A new development of indirect gating case in the differential decay curve method used for lifetime measurement has been introduced. The gate region was extended from partial shifted peak to both shifted and unshifted components. The statistics of flight and stop peaks in gating spectra was improved...

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Veröffentlicht in:Nuclear science and techniques 2018-08, Vol.29 (8), p.48-54, Article 108
Hauptverfasser: Zhong, Jian, Wu, Xiao-Guang, Ma, Ying-Jun, Zheng, Yun, Li, Cong-Bo, Li, Guang-Sheng, Zhu, Bao-Ji, Li, Tian-Xiao, Jin, Yan-Jun, Gao, Yan-Xiang, Ma, Ke-Yan, Yang, Dong, Guo, Hao, Wang, Jia-Qi, Guan, Xian, Sun, Ji
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Sprache:eng
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Zusammenfassung:A new development of indirect gating case in the differential decay curve method used for lifetime measurement has been introduced. The gate region was extended from partial shifted peak to both shifted and unshifted components. The statistics of flight and stop peaks in gating spectra was improved obviously. The reliability of this change has been tested by reanalysing the lifetime of 2 + state in 134 Ce . The result of 32.2(33) ps was fit well with the previous published values within the experimental uncertainty. The developed method was also used to analyse the lifetime of 2 1 + state in 138 Nd .
ISSN:1001-8042
2210-3147
DOI:10.1007/s41365-018-0453-6