Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays

In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain r...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:核技术(英文版) 2014-08, Vol.25 (4), p.16-20
1. Verfasser: 陈敏聪 田丽鸿
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this paper,equivalent energy method is introduced for measuring mass thickness of dual-component samples using dual-energy X-rays.Approximately,the method adopts equivalent mass attenuation coefficients of the two components in mass thickness measurements for dual-component samples,in a certain range of thicknesses.Feasibility of the method is proven by numerical calculations and Monte Carlo simulations(EGSnrc package).The results of absorption experiments using an X-ray machine at tube voltages of 30 and 45 kV,the relative errors are less than 5%between the nominal and detected values.Also,optical low energy is discussed at given high voltages.
ISSN:1001-8042
2210-3147
DOI:10.13538/j.1001-8042/nst.25.040202