Scanning transmission ion microscopy on Fudan SPM facility

Scanning transmission ion microscopy on Fudan SPM facility

In this paper, we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy （SPM） facility. By using Si-PIN diode （Hamamatsu S1223-01） detector, scanning transmission ion microscopy （STIM） measurement system has been set up. It can provide density and structural...

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Veröffentlicht in:核技术（英文版） 2011-10, Vol.22 (5), p.282-286
1. Verfasser: LI Yongqiang SATOH Takahiro SHEN Hao ZHENG Yi LI Xinyi LIU Bo
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SPM
传输
复旦大学
扫描
显微镜
测量系统
离子
设施
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description In this paper, we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy （SPM） facility. By using Si-PIN diode （Hamamatsu S1223-01） detector, scanning transmission ion microscopy （STIM） measurement system has been set up. It can provide density and structural images with high probing efficiency and non-destruction by utilizing the energy loss of high energy （MeV） and focused ions penetrating through a thin sample. STIM measurement is able to map the density distribution of organic elements which mostly compose biology materials, such information can not be detected by using conventional Be-windowed Si （Li） X-ray detector in Particle Induced X-ray Emission （PIXE） technique. The spatial resolution capability of STIM is higher than PIXE technique at same accelerator status. As a result of STIM measurement, paramecium attached on the top of Kapton tube was measured by STIM.
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2210-3147
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source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection
subjects SPM
传输
复旦大学
扫描
显微镜
测量系统
离子
设施
title Scanning transmission ion microscopy on Fudan SPM facility
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