Scanning transmission ion microscopy on Fudan SPM facility

In this paper, we report a novel measurement system based on the development of Fudan Scanning Proton Microscopy （SPM） facility. By using Si-PIN diode （Hamamatsu S1223-01） detector, scanning transmission ion microscopy （STIM） measurement system has been set up. It can provide density and structural images with high probing efficiency and non-destruction by utilizing the energy loss of high energy （MeV） and focused ions penetrating through a thin sample. STIM measurement is able to map the density distribution of organic elements which mostly compose biology materials, such information can not be detected by using conventional Be-windowed Si （Li） X-ray detector in Particle Induced X-ray Emission （PIXE） technique. The spatial resolution capability of STIM is higher than PIXE technique at same accelerator status. As a result of STIM measurement, paramecium attached on the top of Kapton tube was measured by STIM.