Micro-beam XRF localization by a laser beam

O57; A new method for micro-beam XRF localization is presented. A laserbeam along with an incident X-ray hits on the surface of a sample. The micro region onthe sample that reached by X-ray beam can be localized by means of thevisible spot of the laser beam. This method is suitable for X-ray micropr...

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Veröffentlicht in:核技术(英文版) 1999, Vol.10 (4), p.225-229
Hauptverfasser: GUO Panlin, WANG Jiqing, LI Xiaolin, LE Anquan, ZHU Jieqing
Format: Artikel
Sprache:eng
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Zusammenfassung:O57; A new method for micro-beam XRF localization is presented. A laserbeam along with an incident X-ray hits on the surface of a sample. The micro region onthe sample that reached by X-ray beam can be localized by means of thevisible spot of the laser beam. This method is suitable for X-ray microprobesusing anX-ray tube or synchrotron radiation as excitation sources.
ISSN:1001-8042