Testing System Based on Virtual Instrument for Readout Circuit of Infrared Focal Plane Array

Readout integrated circuit(ROIC) is one of the most important components for hybrid-integrated infrared focal plane array(IRFPA). And it should be tested to ensure the product yield before bonding. This paper presents an on-wafer testing system based on Labview for ROIC of IRFPA. The quantitative me...

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Veröffentlicht in:Semiconductor photonics and technology 2008, Vol.14 (2), p.102-106
1. Verfasser: XUE Lian MENG Li-ya YUAN Xiang-hui
Format: Artikel
Sprache:eng
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Zusammenfassung:Readout integrated circuit(ROIC) is one of the most important components for hybrid-integrated infrared focal plane array(IRFPA). And it should be tested to ensure the product yield before bonding. This paper presents an on-wafer testing system based on Labview for ROIC of IRFPA. The quantitative measurement can be conducted after determining whether there is row crosstalk or not in this system. This low-cost system has the benefits of easy expansion, upgrading, and flexibility, and it has been employed in the testing of several kinds of IRFPA ROICs to measure the parameters of saturated output voltage, nonuniformity, dark noise and dynamic range, etc.
ISSN:1007-0206