Internal Defect Measurement of Scattering Media by Optical Coherence Microscopy

Optical coherence microscopy is applied to measure scattering media's internal defect, which based on low coherence interferometry and confocal microscopy. Optical coherence microscopy is more effective in the rejection of out of focus and multiple scattered photons originating further away of...

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Veröffentlicht in:	Semiconductor photonics and technology 2005, Vol.11 (2), p.142-144
1. Verfasser:	ZHUYong-kai ZHAOHong WANGZhao WANGJun-li
Format:	Artikel
Sprache:	eng
Schlagworte:	光学显微术 内部缺陷 散射质 表面光洁度
Online-Zugang:	Volltext
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