Electronic trip unit with thermal capacity measurement and display

Systems and methods for providing information about thermal overload conditions and near-miss tripping events in a circuit interrupter are disclosed. The systems and methods provide a user with detailed information about thermal overload and near-miss tripping events, including how much time remains until a trip will be initiated due to a thermal overload, and what the real-time thermal capacity of the circuit interrupter is after a thermal overload condition ends.