Semiconductor device and method of manufacturing the same

The present disclosure provides a semiconductor device and a method of fabricating the same. The device comprises a substrate; a first semiconductor layer formed on the substrate; a second semiconductor layer formed on the first semiconductor layer; the first semiconductor layer having a smaller forbidden band width than the second semiconductor layer; and a first electrode, a second electrode, and a third electrode formed on the second semiconductor layer; the first semiconductor layer corresponding to the third electrode has a strongly P-type doped first region, and the first semiconductor layer corresponding to the second electrode has a weakly P-type doped second region. The present disclosure contributes to achievement of one of the effects of: reducing a gate leakage current, having a high threshold voltage, high power, and high reliability, allowing a low on-resistance and a normally-off state of the device, and providing a stable threshold voltage, so that the semiconductor device has good switching characteristics.