Method, apparatus and electronic device for read/write speed testing

The present invention provides a method for read/write speed testing, comprising: obtaining a test speed of reading data from or writing data to each of a plurality of memories, the plurality of memories including a random access memory and at least one buffer memory associated with the random acces...

Ausführliche Beschreibung

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1. Verfasser: Zhuhai Juntian Electronic Technology Co., Ltd
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present invention provides a method for read/write speed testing, comprising: obtaining a test speed of reading data from or writing data to each of a plurality of memories, the plurality of memories including a random access memory and at least one buffer memory associated with the random access memory; and determining an actual speed of reading data from or writing data to the random access memory according to the test speed of reading data from or writing data to the each memory. Embodiments of the present invention further disclose an apparatus for read/write speed testing and electronic device. With the embodiments of the present invention, the read/write speed of the random access memory can be tested more accurately.