System and method for obtaining text

A system includes a first supporting element, a first supporting element rotation module, a controller and a first optical head. The controller is configured to control a rotation of the first supporting element by the first supporting element rotation module. The first supporting element is coupled to the first optical head. The first supporting element rotation module is configured to rotate the first supporting element until text that is imprinted on a first side of a semiconductor wafer is located within a field of view of the first optical head. Semiconductors wafers of different size have text located at different locations. A method for obtaining a text imprinted on a first side of a semiconductor wafer, the method includes: determining a location of the text based on a size of the semiconductor wafer; rotating a first supporting element that is coupled to a first optical head until the text is located within a field of view of the first optical head; obtaining an image of the text by the first optical head; and translating the image of the text into text.