Fault modeling for state retention logic

A method for modeling state-retention logic includes: specifying a circuit that includes an arrangement of circuit elements, wherein a portion of the circuit is organized into a power domain with a power-domain control for effecting power variations within the power domain, and the power domain incl...

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Bibliographische Detailangaben
Hauptverfasser: Chakravadhanula, Krishna, Gregor, Steven L, Keller, Brion L, Chickermane, Vivek
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for modeling state-retention logic includes: specifying a circuit that includes an arrangement of circuit elements, wherein a portion of the circuit is organized into a power domain with a power-domain control for effecting power variations within the power domain, and the power domain includes a state-retention cell that includes a retention element with a retention-element control for saving state-retention-cell values in the retention element during power variations in the power domain; determining one or more pattern faults for detecting defects in state-retention operation of the circuit by associating circuit element values with values for the power-domain control or the retention-element control; and saving one or more values for the one or more pattern faults.