Process control using process data and yield data

A method for monitoring a manufacturing tool features acquiring metrology data ("Step a"). Data is acquired for process variables for a first process step performed by the manufacturing tool ("Step b"). A mathematical model of the first process step based on the metrology data an...

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Bibliographische Detailangaben
Hauptverfasser: Byrne, Tamara, Eriksson, Lennart, Wold, Svante Bjarne
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for monitoring a manufacturing tool features acquiring metrology data ("Step a"). Data is acquired for process variables for a first process step performed by the manufacturing tool ("Step b"). A mathematical model of the first process step based on the metrology data and the acquired data is created ("Step c"). Steps b and c are repeated for at least a second process step ("Step d"). An nth mathematical model is created based on the metrology data and the data for the process variables for each of the n process steps ("Step e"). A top level mathematical model is created based on the metrology data and the models created by steps c, d and e ("Step f"). A multivariate metric is calculated based on the top level model of step f and data from subsequent runs of the manufacturing tool. Service is performed if the metric satisfies a condition.