Passivation layer surface topography modifications for improved integrity in packaged assemblies

A structure and method for producing the same is disclosed. The structure includes an organic passivation layer with solids suspended therein. Preferential etch to remove a portion of the organic material and expose portions of such solids creates enhanced surface roughness, which provides a signifi...

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Bibliographische Detailangaben
Hauptverfasser: Blander, Alexandre, Casey, Jon A, Daubenspeck, Timothy H, Melville, Ian D, Muncy, Jennifer V, Paquet, Marie-Claude
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A structure and method for producing the same is disclosed. The structure includes an organic passivation layer with solids suspended therein. Preferential etch to remove a portion of the organic material and expose portions of such solids creates enhanced surface roughness, which provides a significant advantage with respect to adhesion of that passivation layer to the packaging underfill material.