Systems and methods for intelligent probe testing

Systems and methods are disclosed for testing a processor having at least a first interface. In one embodiment, the method includes configuring, at the processor, a second interface, such that the configured second interface has one or more quality of service parameters representative of the first i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kannan, Navneeth N, Gray, Eric W
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Systems and methods are disclosed for testing a processor having at least a first interface. In one embodiment, the method includes configuring, at the processor, a second interface, such that the configured second interface has one or more quality of service parameters representative of the first interface; sending one or more packets through the configured second interface, the one or more packets being representative of another packet received at the first interface; and determining, based on the one or more packets, one or more performance parameters corresponding to the first interface under test.