Apparatus for the determination of a parameter of a molten metal or a slag layer lying on the molten metal
An apparatus is provided for the determination of at least one parameter of a molten metal or a slag layer lying on top of the molten metal. The apparatus has a carrier tube, a measuring head arranged on one end of the carrier tube with a body fixed in the carrier tube. An A/D converter is arranged...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | An apparatus is provided for the determination of at least one parameter of a molten metal or a slag layer lying on top of the molten metal. The apparatus has a carrier tube, a measuring head arranged on one end of the carrier tube with a body fixed in the carrier tube. An A/D converter is arranged within the measuring head or the carrier tube, and the A/D converter is connected to at least one sensor arranged in or on the measuring head. The measuring head has a contact piece, which is electrically connected via its contact terminals to the signal output of the A/D converter, and the contact piece is connected to a lance inserted into the carrier tube. No more than two signal lines are arranged within the lance, the signal lines each being connected at one end via a contact terminal of the contact piece to the A/D converter and at an opposite end to a computer or an analysis device. |
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