Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit

aIn order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers biased in opposite directions by a coil spring, to be electrically connected to a wiri...

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1. Verfasser:	Kazama, Toshio
Format:	Patent
Sprache:	eng
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creator	Kazama, Toshio
description	aIn order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers biased in opposite directions by a coil spring, to be electrically connected to a wiring plate, have electrical connections in which, in a tubular portion as a tight wound spiral portion fixed on one plunger to allow linear flow of electrical signal, the other plunger is brought into slidable contact.
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title	Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
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