Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
aIn order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers biased in opposite directions by a coil spring, to be electrically connected to a wiri...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | aIn order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers biased in opposite directions by a coil spring, to be electrically connected to a wiring plate, have electrical connections in which, in a tubular portion as a tight wound spiral portion fixed on one plunger to allow linear flow of electrical signal, the other plunger is brought into slidable contact. |
|---|