Programmable address space built-in self test (BIST) device and method for fault detection

A built-in self-test (BIST) circuit for testing addressable locations can include a BIST generator that can generate test addresses for testing each addressable location. Defective addresses can be stored in a fault address store. An address range selector circuit can limit the range of addresses generated by an address generator. Once defective addresses for a first range have been detected, an address range selector circuit can test another range. An entire address range can thus be tested regardless of the depth of a fault address store.