Processor test system utilizing functional redundancy

A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a seco...

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Bibliographische Detailangaben

Hauptverfasser:	Choate, Michael L, Nicol, Mark D, Hanson, Heather L, Borsch, Michael J, Ryan, Arthur M, Pandya, Chandrakant
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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