Processor test system utilizing functional redundancy

A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a second memory, independent of the first, is coupled to the test processor by a second memory bus. The first and second memories are identical. A memory bus comparator coupled to the first and second memory buses compares memory bus signals generated by the gold and test processors, and selectively provide a first indication if a mismatch occurs. A peripheral bus comparator is also coupled to the gold and test processors, and compares downstream transactions generated by the gold and test processors and to provide a second indication if a peripheral bus comparison results in a mismatch.