Test signal generating apparatus
The present invention is to provide a test signal generating apparatus which can generate a test signal for testing a device that dynamically change its operational state in response to a signal or the like. The test signal generating apparatus includes: a pattern storage unit having patterns; a pat...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present invention is to provide a test signal generating apparatus which can generate a test signal for testing a device that dynamically change its operational state in response to a signal or the like. The test signal generating apparatus includes: a pattern storage unit having patterns; a pattern selecting unit for selecting a pattern from among the patterns; a test signal generating unit for generating a test signal having a pattern selected by the pattern selecting unit , a trigger signal receiving unit for receiving at least one trigger signal, and a pattern map storage unit having a pattern map defining the number of repetitions for each pattern and a pattern corresponding to a test signal to be generated by the test signal generating unit after the test signal generating unit repeats the test signal on the basis of the number of repetitions. |
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