Computed tomography systems and related methods involving multi-target inspection
Computed tomography (CT) systems and related methods involving multi-target inspection are provided are provided. In this regard, a representative method includes: simultaneously directing X-rays toward multiple targets from an X-ray source; during the directing of the X-rays, independently reorient...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Computed tomography (CT) systems and related methods involving multi-target inspection are provided are provided. In this regard, a representative method includes: simultaneously directing X-rays toward multiple targets from an X-ray source; during the directing of the X-rays, independently reorienting the targets with respect to the X-ray source; and obtaining information corresponding to attenuation of the X-rays attributable to the multiple targets for producing computed tomography images of the targets. |
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