Multi-frequency image processing for inspecting parts having complex geometric shapes

A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the s...

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Bibliographische Detailangaben
Hauptverfasser: Suh, Ui Won, Gambrell, Gigi Olive, McKnight, William Stewart, Pisupati, Preeti, Mishra, Peyush Kumar, Dewangan, Sandeep Kumar, Wang, Changting
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.