Test stage for a carrier having printhead integrated circuitry thereon
This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carr...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carrier. A clamping mechanism is arranged on the fixture. The clamping mechanism has at least one clamp assembly for clamping the carrier to the test stage. A controller controls operation of the clamping mechanism. |
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